Rauch, Stewart : rechercher sur Z-Library

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1

Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies

Giuseppe La Rosa, Stewart E. Rauch III

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 496 KB

english, 2007

2

Insights in the Physical Damage of $V_{\rm GS} = V_{\rm DS}$ High-$k$ PMOSFET Degradation in AC Switching Conditions

La Rosa, Giuseppe, Rauch, Stewart, Guarin, Fernando, Boffoli, Steve

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 849 KB

english, 2013

3

Rethinking therapeutic strategies in cancer: Wars, fields, anomalies and monsters

Stewart, Simon, Rauch, Cyril

Journal:

Social Theory & Health

Année:

2016

Langue:

english

Fichier:

PDF, 184 KB

english, 2016

4

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Dielectric Characterization and Reliability Methodology

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 4.22 MB

english, 2009

5

Physical and biological characteristics of multi drug resistance (MDR): An integral approach considering pH and drug resistance in cancer

Omran, Ziad, Scaife, Paula, Stewart, Simon, Rauch, Cyril

Journal:

Seminars in Cancer Biology

Année:

2017

Langue:

english

Fichier:

PDF, 750 KB

english, 2017

6

Amygdala activation in response to facial expressions in pediatric obsessive–compulsive disorder

Jennifer C. Britton, S. Evelyn Stewart, William D.S. Killgore, Isabelle M. Rosso, Lauren M. Price, Andrea L. Gold, Daniel S. Pine, Sabine Wilhelm, Michael A. Jenike, Scott L. Rauch

Journal:

Depression and Anxiety

Année:

2010

Langue:

english

Fichier:

PDF, 185 KB

english, 2010

7

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., Rodbell, Kenneth P., LaBel, Kenneth A., Schwank, James R., Rauch, Stewart E., Hakey, Mark C., Berg, Melanie D., Castaneda, Carlos M., Dodd, P

Journal:

IEEE Transactions on Nuclear Science

Année:

2009

Langue:

english

Fichier:

PDF, 660 KB

english, 2009

8

Molecular cloning of mast cell growth factor, a hematopoietin that is active in both membrane bound and soluble forms

Dirk M. Anderson, Stewart D. Lyman, Allison Baird, Janis M. Wignall, June Eisenman, Charles Rauch, Carl J. March, H.Scott Boswell, Steven D. Gimpel, David Cosman, Douglas E. Williams

Journal:

Année:

1990

Langue:

english

Fichier:

PDF, 1.20 MB

english, 1990

9

Identification of a ligand for the c-kit proto-oncogene

Douglas E. Williams, June Eisenman, Allison Baird, Charles Rauch, Kirk Van Ness, Carl J. March, Linda S. Park, Unja Martin, Diane Y. Mochizukl, H.Scott Boswell, Gem S. Burgess, David Cosman, Stewart D

Journal:

Année:

1990

Langue:

english

Fichier:

PDF, 1.24 MB

english, 1990

10

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Impact of NBTI Induced Statistical Variation to SRAM Cell Stability

Rosa, Giuseppe, Ng, Wee, Rauch, Stewart, Wong, Robert, Sudijono, John

Année:

2006

Langue:

english

Fichier:

PDF, 1.66 MB

english, 2006

11

Prose recall in first-grade children using imagery, pictures, and questions

Wooldridge, Peter, Nall, Lynn, Hughes, Lonnie, Rauch, Thyra, Stewart, Greg, Richman, Charles L.

Journal:

Bulletin of the Psychonomic Society

Année:

1982

Langue:

english

Fichier:

PDF, 1002 KB

english, 1982

12

A Genetic Family-Based Association Study of OLIG2 in Obsessive-compulsive Disorder

Stewart, S. Evelyn, Platko, Jill, Fagerness, Jesen, Birns, Julie, Jenike, Eric, Smoller, Jordan W., Perlis, Roy, Leboyer, Marion, Delorme, Richard, Chabane, Nadia, Rauch, Scott L., Jenike, Michael A.,

Journal:

Archives of General Psychiatry

Année:

2007

Langue:

english

Fichier:

PDF, 147 KB

english, 2007

13

Brain white matter integrity and association with age at onset in pediatric obsessive-compulsive disorder

Rosso, Isabelle M, Olson, Elizabeth A, Britton, Jennifer C, Stewart, S, Papadimitriou, George, Killgore, William, Makris, Nikos, Wilhelm, Sabine, Jenike, Michael A, Rauch, Scott L

Journal:

Biology of Mood & Anxiety Disorders

Année:

2014

Langue:

english

Fichier:

PDF, 1.08 MB

english, 2014

14

Current legal developments

NJ Botha, JOHN REDGMENT, TE SCHEEPERS, RAHIM KAHN, C DILLON, B WANDA, ND MHURA, AH ANGELO, J CHURCH, L BARNARD, ER DUTKIEWICZ, PKA AMOAH, ELM SIVUKU, ANTON RAUCH, MUNA NDULO, STEWART CANT and IAN DONO

Journal:

The Comparative and International Law Journal of Southern Africa

Année:

1983

Langue:

english

Fichier:

PDF, 5.05 MB

english, 1983

15

SPIE Proceedings [SPIE Microelectronic Processing '92 - San Jose, CA (Sunday 20 September 1992)] Submicrometer Metallization: Challenges, Opportunities, and Limitations - Modeling stress-induced void growth in Al-4wt%Cu lines

Rauch, Stewart E., Sullivan, Timothy D., Kwok, Thomas, Kikkawa, Takamaro, Shenai, Krishna

Année:

1993

Langue:

english

Fichier:

PDF, 889 KB

english, 1993

16

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Negative Bias Temperature Instabilities in pMOSFET Devices

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 3.06 MB

english, 2009

17

[IEEE ESSDERC 2016 - 46th European Solid-State Device Research Conference - Lausanne, Switzerland (2016.9.12-2016.9.15)] 2016 46th European Solid-State Device Research Conference (ESSDERC) - A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs

Sharma, Prateek, Tyaginov, Stanislav, Rauch, Stewart E., Franco, Jacopo, Kaczer, Ben, Makarov, Alexander, Vexler, Mikhail I., Grasser, Tibor

Année:

2016

Langue:

english

Fichier:

PDF, 2.72 MB

english, 2016

18

Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach

Sharma, Prateek, Tyaginov, Stanislav, Rauch, Stewart E., Franco, Jacopo, Makarov, Alexander, Vexler, Mikhail I., Kaczer, Ben, Grasser, Tibor

Journal:

IEEE Electron Device Letters

Année:

2017

Langue:

english

Fichier:

PDF, 899 KB

english, 2017

19

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Dielectric Breakdown of Gate Oxides: Physics and Experiments

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 3.03 MB

english, 2009

20

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Introduction

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 1.25 MB

english, 2009

21

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Frontmatter

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 222 KB

english, 2009

22

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Electromigration

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 2.56 MB

english, 2009

23

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Index

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 117 KB

english, 2009

24

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Stress-Induced Voiding

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 4.26 MB

english, 2009

25

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Hot Carriers

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Langue:

english

Fichier:

PDF, 3.21 MB

english, 2009

26

Reliability Wearout Mechanisms in Advanced CMOS Technologies ||

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Année:

2009

Fichier:

PDF, 21.10 MB

2009

27

[IEEE 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Penang, Malaysia (2020.4.6-2020.4.21)] 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - First Time Enablement of RF Reliability Simulation Using Cadence Relxpert

Vishnoi, Rajat, Satish, Naga, Rauch, Stewart, Guarin, Fernando

Année:

2020

Fichier:

PDF, 599 KB

2020

28

[IEEE 2020 IEEE 29th North Atlantic Test Workshop (NATW) - Albany, NY, USA (2020.6.17-2020.6.24)] 2020 IEEE 29th North Atlantic Test Workshop (NATW) - Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics

Rauch, Stewart, Lee, Dongho, Vert, Alexey, Gupta, Roy

Année:

2020

Fichier:

PDF, 1.44 MB

2020